256GB SATA III 6Gb/s 3D TLC NAND mSATA Solid State Drive

256GB SATA III 6Gb/s 3D TLC NAND mSATA Solid State DriveDescription: 3D NAND Flash Technology Global Wear Leveling and Early weak block retirement TRIM, NCQ, DEVSLP, ATA Security Feature Set supported Lifetime Enhancements Direct to TLC and SLC Cache enhancement to ensure the optimized WAF Block Page RAID function to ensure data recovery StaticDataRefresh to keep data integrity Reliable Industrial grade integrated Active PMU and complete protection design with OVP, OCP, Surge rejection and Short protection

Description:

• 3D NAND Flash Technology

• Global Wear Leveling and Early weak block retirement

• TRIM, NCQ, DEVSLP, ATA Security Feature Set supported

• Lifetime Enhancements

-Direct-to-TLC and SLC Cache enhancement to ensure the optimized WAF

-Block/Page RAID function to ensure data recovery

- StaticDataRefresh to keep data integrity

• Reliable Industrial grade integrated Active PMU and complete protection design with OVP, OCP, Surge rejection and Short protection

• External DRAM to achieve the optimal sustained read/write performance (R/S series)

• Power shielding firmware architecture to ensure power failure resilience

• Warranty: 3 years and within TBW

Specifications:
• Form Factor: mSATA Solid State Drive (51 mm x 30 mm x 3.5 mm)
• Compliance: SATA Revision 3.1 - 6 Gbit/s (3 Gbit/s and 1.5 Gbit/s backward compatible)

• Command Sets: Supports ATA/ATAPI-8 and ACS-2

• Performance:

- Sequential Read/Write (max. ): 350/165 MB/s

- Random 4K Read/Write (IOPS max.): 25000/18000

• Operating Temperature Range: 0 °C to 70 °C

• Storage Temperature Range: -55 °C to 95 °C

• Operating Voltage: 3.3 V ± 10%
• Power Consumption (max.)

- Read (active) : 445mA

- Write (active): 405mA

- Stand-by: 160mA

• Data Retention @40 °C: 10 Years @ Life Begin; 1 Year @ Life End

• Endurance in Tera Bytes Written (TBW) : 93 TB

*TBW is estimated by formula TBW= (Capacity x PE Cycles)/ (WAF x2). Assumption of guard band for the wear leveling is 2.

• Mechanical (IEC-60068)

- Vibration: 15G, 10 ~ 2001Hz

- Drop: 76cm

- Shock: 1,[email protected]

• LDPC ECC with up to 120 bit correction per 1 KByte page to ensure reliable 3K PE cycles
• Mean Time Between Failure: > 2,000,000 hours
• Data Reliability: Non-recover Read (UBER) ≤10 -16

• Serious quality control and assurance

- 100% NAND Flash screening.

- High endurance product design with SLC and pSLC product offerings.

- Implement high/low temperature dynamic burn-in in each lot production to monitor production quality to meet design specification.

- Reliability criteria compliant with international standards IEC-60068/61000.